This series is specifically designed to bring together practitioners and researchers to enhance information-sharing and promote collaboration among the impression, pattern and trace evidence, law enforcement and legal communities. The series will also provide unique educational opportunities for forensic examiners in the disciplines of impression, pattern and trace evidence.
The presentations and their authors are listed below:
- The Houston's Forensic Science Center's Path to a Novel Model for Independence - Irma Rios
- NIST Research Ballistics Toolmark Database - Xiaoyu Alan Zheng
- Error Rates and Random Match Probabilities Based on the 10-Barrel Test and the GLOCK Cartridge Cases Test - James Hamb
If you have questions about this course or difficulty with login or registration, contact the Forensic Science Technology Center of Excellence.