NCJ Number
415
Journal
Analytical Chemistry Volume: 42 Issue: 12 Dated: OCTOBER 1970 Pages: 1399-1402
Date Published
1970
Length
4 pages
Annotation
THE POSITION OF THE RF SPARK WITH RESPECT TO THE ENTRANCE SLIT IN SPARK SOURCE MASS SPECTROMETRY IS DISCUSSED.
Abstract
THIS POSITION AFFECTS RESOLUTION, LINE INTENSITY, AND RELATIVE SENSITIVITY. LINES ARE SHOWN QUANTITATIVELY TO BE SHARPER AT LONGER SPARK TO SLIT DISTANCES. LINE INTENSITIES VARY WITH THIS PARAMETER. RELATIVE SENSITIVITY FACTORS IN COPPER, ALUMINUM, AND STEEL MATRICES ARE DEPENDENT UPON SPARK POSITION. ION PROFILES AS A FUNCTION OF THE Y-DEFLECTOR VOLTAGE ARE SHOWN FOR +1 THROUGH +5 IONS OF COPPER.
Date Published: January 1, 1970
Downloads
Similar Publications
- Exploring Cranial Growth Patterns from Birth to Adulthood for Forensic Research and Practice
- Forgotten Spaces: The Structural Disappearance of Migrants in South Texas, chapter in The Marginalized in Death: A Forensic Anthropology of Intersectional Identity in the Modern Era
- Reporting the value of biological findings given activity level propositions: A discussion of published recommendations