THE POSITION OF THE RF SPARK WITH RESPECT TO THE ENTRANCE SLIT IN SPARK SOURCE MASS SPECTROMETRY IS DISCUSSED.
THIS POSITION AFFECTS RESOLUTION, LINE INTENSITY, AND RELATIVE SENSITIVITY. LINES ARE SHOWN QUANTITATIVELY TO BE SHARPER AT LONGER SPARK TO SLIT DISTANCES. LINE INTENSITIES VARY WITH THIS PARAMETER. RELATIVE SENSITIVITY FACTORS IN COPPER, ALUMINUM, AND STEEL MATRICES ARE DEPENDENT UPON SPARK POSITION. ION PROFILES AS A FUNCTION OF THE Y-DEFLECTOR VOLTAGE ARE SHOWN FOR +1 THROUGH +5 IONS OF COPPER.
Downloads
Similar Publications
- Mitochondrial DNA Analysis by Denaturing High-Performance Liquid Chromatography for the Characterization and Separation of Mixtures in Forensic Samples
- Neuro-physiological Underpinnings of User-centered Security
- Post-burn and Post-blast Rapid Detection of Trace and Bulk Energetics by 3D-printed Cone Spray Ionization Mass Spectrometry