Opening Remarks at the 2018 Impression, Pattern, and Trace Evidence Symposium, Ted Hunt
This event brought together practitioners and researchers to enhance information-sharing and promote collaboration among the impression, pattern, and trace evidence analysts, law enforcement, and legal communities.
The symposium was presented by the NIJ Forensic Technology Center of Excellence January 22-25, 2018.
Disclaimer:
Opinions or points of view expressed in these recordings represent those of the speakers and do not necessarily represent the official position or policies of the U.S. Department of Justice. Any commercial products and manufacturers discussed in these recordings are presented for informational purposes only and do not constitute product approval or endorsement by the U.S. Department of Justice.
- Thematic Trends of Latent Print Examination Criticisms and Reports
- Sufficiency and Complexity Factors in Handwriting Examination
- Objective Comparison of Striated Toolmarks Produced from Ten Consecutively Manufactured Cold Chisels Measured by Contact and Optical Surface Profilometry and Comparison Microscopy