Instrumental Validation of a Scanning Electron Microscope with Energy Dispersive X-Ray Spectroscopy
This event brought together practitioners and researchers to enhance information-sharing and promote collaboration among the impression, pattern, and trace evidence analysts, law enforcement, and legal communities.
The symposium was presented by the NIJ Forensic Technology Center of Excellence January 22-25, 2018.
Disclaimer:
Opinions or points of view expressed in these recordings represent those of the speakers and do not necessarily represent the official position or policies of the U.S. Department of Justice. Any commercial products and manufacturers discussed in these recordings are presented for informational purposes only and do not constitute product approval or endorsement by the U.S. Department of Justice.
Date Published: January 22, 2018
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