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Strategies & Considerations for Trace Detection of Fentalogs (part of the "Opioid Crisis: A Public Health Webinar Series")

Event Dates
October 26, 2017, 1:00 pm EDT - October 26, 2017, 2:00 pm EDT
Event Duration
1 hour
Location
Online

This webinar provides strategies & considerations for the trace detection of fentanyl and its analogs. The focus will be on TD-DART-MS and IMS analysis as well as understanding the fate of fentanyl residues that are exposed to different environments.

Fentanyl and fentanyl analogs pose a significant and ever changing threat in the United States as both pure compounds and in complex mixtures. While commonly considered detection techniques require visible amounts of powder (i.e. color tests or GC/MS analysis), trace detection and identification methods present both a unique opportunity and a unique set of challenges. Rapid detection of non-visible residues containing fentanyl, or similar compounds, can be extremely useful in minimizing exposure of law enforcement at scenes, assessing public health implications, triaging evidence in forensic laboratories, and intelligence gathering. For trace detection to be successful the technique needs to be rapid, specific, capable of handling complex background matrices, and minimize the risk of exposure to the analyst. There also must be confidence that a detectable level of residue exists on the surface and remains present on the surface after exposure to the environment. This webinar will highlight two potential tools for the trace detection of fentanyl and NPS residues, thermal desorption direct analysis in real time mass spectrometry (TD-DART-MS) and ion mobility spectrometry (IMS) while also providing context to the issues of expected residue contamination levels and environmental stability.

Contact Information

If you have questions about this course or difficulty with login or registration, contact the Forensic Science Technology Center of Excellence.

 


Presenter(s):
Ed Sisco

 

Event Type
Webinar
Event Option(s)
Online, On demand
Host(s)
NIJ Forensic Technology Center of Excellence (RTI International)
Registration Dates
September 13, 2017 - October 26, 2017
Registration Status
Open
Eligibility
​Free and open to all.
Date Created: September 14, 2017